In the Exhibition, we exhibit “The Pattern-Matching Inspection System” combined of NEWLY’s original inspection algorithm and special scanner for visual inspection.
【Period】November 30th (Wed), 2016 ~ December 2nd (Fri) , 2016
・ Nov 30th (Wed) 13:00~17:00
・ Dec 1st (Thu) 10:00~17:00
・ Dec 2nd (Fri) 10:00~16:00
【Venue】TOKYO BIG SIGHT, East 7 and 8 hall
【Our stand】East 7 hall, #305
【Exhibition products】
1) Quick Inspection system by pattern-matching technology
Feature
– Easy to process an inspection by Pattern-matching
– High-speed processing
– Customize-ability to be suitable for your objects
2) Electrodes inspection device for ACF terminals and gold fingers
Feature
– Easily detect very fine scratches, stains and breakage and more
– Automated inspection by outstanding high-resolution (0.015mm)
3) High-resolution film scanner
【Further inquiry】 https://www.newly.co.jp/inquiry_e/
【Official site】 Japan SMEs Tech & Service 2016 (Japanese only) >>